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Nakatani, Takeshi; Agui, Akane; Yoshigoe, Akitaka; Matsushita, Tomohiro*; Takao, Masaru*; Takeuchi, Masao*; Aoyagi, Hideki*; Tanaka, Hitoshi*
JAERI-Tech 2004-013, 16 Pages, 2004/12
JAERI-Tech-2004-013.pdf:3.55MB
We observed two characteristic electron orbit fluctuations caused when the phase of ID23 (APPLE-2 type undulator) installed at SPring-8 was driven. One was caused by the variation of magnetic error filed of ID23 when the phase was driven. The other was caused by the noise from the phase drive system which adoped AC servomotors. We measured these orbit fluctuations synchronized with the phase motion using the real-time electron beam position measurement system. The part of the orbit fluctuation was supressed by the correction table which was made referring to the obtained data.
Nakatani, Takeshi; Agui, Akane; Yoshigoe, Akitaka; Matsushita, Tomohiro*; Takao, Masaru*; Aoyagi, Hideki*; Takeuchi, Masao*; Tanaka, Hitoshi*
AIP Conference Proceedings 705, p.290 - 293, 2004/00
We have developed a new method to extract only the orbit fluctuation caused by changing magnetic field error of an insertion device (ID). This method consists of two main parts. (i) The orbit fluctuation is measured with modulating the error field of the ID by using the real-time beam position measuring system. (ii) The orbit fluctuation depending on the variation of the error field of the ID is extracted by the filter applying the Wavelet Transform. We call this approach the amplitude modulation method. This analysis technique was applied to measure the orbit fluctuation caused by the error field of APPLE-2 type undulator (ID23) installed in the SPring-8 storage ring. We quantitatively measured two kinds of the orbit fluctuation which are the static term caused by the magnetic field error and the dynamic term caused by the eddy current on the ID23 chamber.
Matsushita, Tomohiro*; Agui, Akane; Yoshigoe, Akitaka; Takao, Masaru*; Aoyagi, Hideki*; Takeuchi, Masao*; Nakatani, Takeshi; Tanaka, Hitoshi*
AIP Conference Proceedings 705, p.21 - 24, 2004/00
no abstracts in English
